Modbus-rtu/PLSR/Inc/plsr_self_test.h

#ifndef PLSR_SELF_TEST_H
#define PLSR_SELF_TEST_H

#include "plsr_types.h"

#ifdef __cplusplus
extern "C" {
#endif

/* 上电自测：Q0(A)/Q1(B) 输出三段 AB 正交周期，末段反向。
 * 用于 P3b-2 上板验证，验证完成后应关闭。 */
PLSR_RESULT PlsrSelfTestQueue(void);

/* P4-2 当量换算上板自测：Q0=PULSE、Y4=DIR，两段各1工程单位；
 * 3脉冲/2单位比例下应依次输出1、2个脉冲。 */
PLSR_RESULT PlsrEquivalentSelfTestQueue(void);

/* P5 protection-chain board test: Q0=PULSE, Q4=DIR.  The commanded
 * distance is deliberately longer than the +500-pulse soft limit. */
PLSR_RESULT PlsrProtectionSelfTestQueue(void);

/* P6 board test: start four independent PULSE/DIR axes together. */
PLSR_RESULT PlsrFourAxisSelfTestQueue(void);

/* P7 board test: three segments exercise negative and positive backlash. */
PLSR_RESULT PlsrBacklashSelfTestQueue(void);

/* P8 board test: Q4/Q3 show positive/negative DIR logic side by side. */
PLSR_RESULT PlsrDirectionLogicSelfTestQueue(void);

/* P9 board test: Q0=CW and Q1=CCW, with strict channel interlock. */
PLSR_RESULT PlsrCwCcwSelfTestQueue(void);

/* P10 board test: Q0 uses 1ms refresh, Q1 uses 0.1ms refresh. */
PLSR_RESULT PlsrFastRefreshSelfTestQueue(void);
PLSR_RESULT PlsrDynamicFrequencySelfTestQueue(void);
/* P12: S0=D1000, S1=D1100; D1010/D1011 is changed by a Modbus master. */
PLSR_RESULT PlsrModbusDataSelfTestQueue(void);
/* P13 prepares deterministic SFD K1 data; motion is commanded via Modbus. */
PLSR_RESULT PlsrModbusControlSelfTestPrepare(void);
void PlsrSelfTestControlTick100us(void);

/* P11 board-test control.  Write this signed dword from IAR Watch while the
 * test is running; it represents the live S0 current-segment frequency. */
extern volatile int32_t PlsrSelfTestLiveFrequencyHz;
extern volatile uint32_t PlsrSelfTestDynamicTick100us;
extern volatile uint8_t PlsrSelfTestDynamicPhase;

#ifdef __cplusplus
}
#endif

#endif /* PLSR_SELF_TEST_H */