Modbus-rtu/PLSR/Test/test_plsr_job.c

#include "plc_device.h"
#include "plsr_core.h"
#include "plsr_job.h"
#include "plsr_persistence.h"
#include <stdio.h>
#include <string.h>

#define TEST_WORD_CAPACITY  (3000U)
#define TEST_BIT_CAPACITY   (128U)

typedef struct
{
    uint16_t words[3][TEST_WORD_CAPACITY];
    uint8_t bits[3][TEST_BIT_CAPACITY];
} TEST_MEMORY;

static int TestFailures;
static int TestChecks;

#define CHECK(condition)                                                     \
    do                                                                       \
    {                                                                        \
        TestChecks++;                                                        \
        if (!(condition))                                                    \
        {                                                                    \
            TestFailures++;                                                  \
            (void)printf("FAIL line %d: %s\n", __LINE__, #condition);       \
        }                                                                    \
    } while (0)

static uint8_t TestValidateWords(void *context,
                                 PLSR_DEVICE_TYPE device,
                                 uint32_t firstAddress,
                                 uint32_t wordCount)
{
    (void)context;
    if ((device > PLSR_DEVICE_FD) || (wordCount == 0UL))
    {
        return 0U;
    }
    return (((uint64_t)firstAddress + wordCount) <= TEST_WORD_CAPACITY)
               ? 1U
               : 0U;
}

static uint8_t TestReadWord(void *context,
                            PLSR_DEVICE_TYPE device,
                            uint32_t address,
                            uint16_t *value)
{
    TEST_MEMORY *memory = (TEST_MEMORY *)context;

    if ((memory == NULL) || (value == NULL) || (device > PLSR_DEVICE_FD)
        || (address >= TEST_WORD_CAPACITY))
    {
        return 0U;
    }
    *value = memory->words[device][address];
    return 1U;
}

static uint8_t TestReadBit(void *context,
                           PLSR_DEVICE_TYPE device,
                           uint32_t address,
                           uint8_t *value)
{
    TEST_MEMORY *memory = (TEST_MEMORY *)context;
    uint8_t index;

    if ((memory == NULL) || (value == NULL) || (device < PLSR_DEVICE_X)
        || (device > PLSR_DEVICE_HM) || (address >= TEST_BIT_CAPACITY))
    {
        return 0U;
    }
    index = (uint8_t)(device - PLSR_DEVICE_X);
    *value = memory->bits[index][address];
    return 1U;
}

static void TestWriteDword(TEST_MEMORY *memory,
                           PLSR_DEVICE_TYPE device,
                           uint32_t address,
                           int32_t value)
{
    uint32_t raw = (uint32_t)value;

    memory->words[device][address] = (uint16_t)(raw & 0xFFFFUL);
    memory->words[device][address + 1UL] = (uint16_t)(raw >> 16U);
}

static void TestWriteSfdDword(uint16_t address, uint32_t value)
{
    CHECK(PlcDeviceWriteSfd(address, (int32_t)(value & 0xFFFFUL))
          == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd((uint16_t)(address + 1U),
                            (int32_t)(value >> 16U))
          == PLC_DEVICE_OK);
}

static void TestConfigureAxis0K1(void)
{
    CHECK(PlcDeviceWriteSfd(900U, 0) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(906U, 4) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(907U, 10) == PLC_DEVICE_OK);
    TestWriteSfdDword(950U, 1000UL);
    CHECK(PlcDeviceWriteSfd(952U, 100) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(953U, 120) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(954U, 10) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(955U, 0) == PLC_DEVICE_OK);
    TestWriteSfdDword(956U, 100000UL);
    TestWriteSfdDword(958U, 120000UL);
    TestWriteSfdDword(960U, 500UL);
    CHECK(PlcDeviceWriteSfd(962U, 50) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(963U, 20) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(964U, 0) == PLC_DEVICE_OK);
    TestWriteSfdDword(966U, 2000UL);
    TestWriteSfdDword(968U, 200UL);
}

static void TestBuildValidBlocks(TEST_MEMORY *memory)
{
    (void)memset(memory, 0, sizeof(*memory));
    TestWriteDword(memory, PLSR_DEVICE_D, 100U, 2);

    TestWriteDword(memory, PLSR_DEVICE_D, 110U, 150000);
    TestWriteDword(memory, PLSR_DEVICE_D, 112U, 100);
    memory->words[PLSR_DEVICE_D][114U] = 0U;
    TestWriteDword(memory, PLSR_DEVICE_D, 115U, 0);
    memory->words[PLSR_DEVICE_D][117U] = 0U;
    TestWriteDword(memory, PLSR_DEVICE_D, 118U, 0);

    TestWriteDword(memory, PLSR_DEVICE_D, 120U, 0);
    TestWriteDword(memory, PLSR_DEVICE_D, 122U, -50);
    memory->words[PLSR_DEVICE_D][124U] = 0x0100U;
    TestWriteDword(memory, PLSR_DEVICE_D, 125U, 0);
    memory->words[PLSR_DEVICE_D][127U] = 0U;
    TestWriteDword(memory, PLSR_DEVICE_D, 128U, 2);

    TestWriteDword(memory, PLSR_DEVICE_D, 200U, 0);
    TestWriteDword(memory, PLSR_DEVICE_D, 202U, 0);
    TestWriteDword(memory, PLSR_DEVICE_HD, 10U, 1);
}

static PLSR_CALL TestMakeCall(TEST_MEMORY *memory)
{
    PLSR_CALL call;

    (void)memset(&call, 0, sizeof(call));
    call.sequence = 77UL;
    call.source.context = memory;
    call.source.validateWords = TestValidateWords;
    call.source.readWord = TestReadWord;
    call.source.readBit = TestReadBit;
    call.s0.device = PLSR_DEVICE_D;
    call.s0.address = 100UL;
    call.s1.device = PLSR_DEVICE_D;
    call.s1.address = 200UL;
    call.s2.type = PLSR_OPERAND_CONSTANT;
    call.s2.constant = 1;
    call.dAxis = 0U;
    call.outputModeOverride = PLSR_OUTPUT_MODE_FROM_SFD;
    return call;
}

static void TestValidSnapshotAndLiveFrequency(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_PARSE_CONTEXT context;
    PLSR_JOB_SNAPSHOT snapshot;
    PLSR_PARSE_DETAIL detail;
    uint32_t frequency;
    uint8_t clamped;

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    context.logicalPosition = 0;
    context.positionValid = 0U;
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_OK);
    CHECK(detail.result == PLSR_RESULT_OK);
    CHECK(snapshot.segmentCount == 2U);
    CHECK(snapshot.startSegment == 1U);
    CHECK(snapshot.s2Set == 1U);
    CHECK(snapshot.outputMode == PLSR_OUTPUT_PULSE_DIR);
    CHECK(snapshot.directionPoint == 4U);
    CHECK(snapshot.s2.defaultSpeed == 1000UL);
    CHECK(snapshot.s2.maximumSpeed == 100000UL);
    CHECK(snapshot.s2.startSpeed == 100000UL);
    CHECK(snapshot.speedClamped == 1U);
    CHECK(snapshot.segments[0].targetFrequency == 100000UL);
    CHECK((snapshot.segments[0].flags & PLSR_SEGMENT_FLAG_SPEED_CLAMPED)
          != 0U);
    CHECK(snapshot.segments[1].targetFrequency == 1000UL);
    CHECK((snapshot.segments[1].flags & PLSR_SEGMENT_FLAG_DEFAULT_SPEED)
          != 0U);
    CHECK((snapshot.segments[1].flags & PLSR_SEGMENT_FLAG_SELF_LOOP) != 0U);
    CHECK(snapshot.hasSelfLoop == 1U);
    CHECK(snapshot.initialDirectionPositive == 1U);

    TestWriteDword(&memory, PLSR_DEVICE_D, 112U, 9999);
    CHECK(snapshot.segments[0].pulseOrTarget == 100);
    TestWriteDword(&memory, PLSR_DEVICE_D, 110U, 2500);
    CHECK(PlsrResolveLiveFrequency(&snapshot, 1U, &frequency, &clamped)
          == PLSR_RESULT_OK);
    CHECK(frequency == 2500UL);
    CHECK(clamped == 0U);
    TestWriteDword(&memory, PLSR_DEVICE_D, 110U, 200000);
    CHECK(PlsrResolveLiveFrequency(&snapshot, 1U, &frequency, &clamped)
          == PLSR_RESULT_OK);
    CHECK(frequency == 100000UL);
    CHECK(clamped == 1U);

    call.s2.type = PLSR_OPERAND_DATA;
    call.s2.data.device = PLSR_DEVICE_HD;
    call.s2.data.address = 10UL;
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_OK);
    CHECK(snapshot.s2Set == 1U);
}

static void TestValidationFailures(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_PARSE_CONTEXT context = {0, 0U};
    PLSR_JOB_SNAPSHOT snapshot;
    PLSR_PARSE_DETAIL detail;

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    call.s1.address = 120UL;
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_BLOCK_OVERLAP);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    memory.words[PLSR_DEVICE_D][103U] = 1U;
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_RESERVED_NOT_ZERO);
    CHECK(detail.address == 103UL);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    TestWriteDword(&memory, PLSR_DEVICE_D, 100U, 101);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_SEGMENT_OVERFLOW);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    TestWriteDword(&memory, PLSR_DEVICE_D, 110U, -1);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_INVALID_FREQUENCY);
    CHECK(detail.segment == 1U);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    memory.words[PLSR_DEVICE_D][124U] = 0x0405U;
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_INVALID_WAIT);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    TestWriteDword(&memory, PLSR_DEVICE_D, 128U, 3);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_INVALID_JUMP);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    TestWriteDword(&memory, PLSR_DEVICE_D, 118U, 2);
    TestWriteDword(&memory, PLSR_DEVICE_D, 128U, 1);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_PATH_CYCLE);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    TestWriteDword(&memory, PLSR_DEVICE_D, 200U, 1);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_POSITION_INVALID);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    call.s0.address = UINT32_MAX - 5UL;
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_ADDRESS_OVERFLOW);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    call.s2.constant = 5;
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_INVALID_S2);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    CHECK(PlcDeviceWriteSfd(962U, 356) == PLC_DEVICE_OK);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_INVALID_S2);
    CHECK(PlcDeviceWriteSfd(962U, 50) == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(964U, 1) == PLC_DEVICE_OK);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_INVALID_S2);
    CHECK(PlcDeviceWriteSfd(964U, 0) == PLC_DEVICE_OK);
}

static void TestDynamicReferences(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_PARSE_CONTEXT context = {0, 0U};
    PLSR_JOB_SNAPSHOT snapshot;
    PLSR_PARSE_DETAIL detail;

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    memory.words[PLSR_DEVICE_D][124U] = 0x0101U;
    TestWriteDword(&memory, PLSR_DEVICE_D, 125U, 300);
    TestWriteDword(&memory, PLSR_DEVICE_D, 300U, 25);
    memory.words[PLSR_DEVICE_D][127U] = 1U;
    TestWriteDword(&memory, PLSR_DEVICE_D, 128U, 302);
    TestWriteDword(&memory, PLSR_DEVICE_D, 302U, 2);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_OK);
    CHECK(snapshot.segments[1].waitSource == PLSR_VALUE_D);
    CHECK(snapshot.segments[1].waitValueOrAddress == 300);
    CHECK(snapshot.segments[1].jumpSource == PLSR_VALUE_D);
    CHECK(snapshot.segments[1].jumpValueOrAddress == 302);

    memory.words[PLSR_DEVICE_D][124U] = 0x0404U;
    TestWriteDword(&memory, PLSR_DEVICE_D, 125U, 7);
    memory.bits[0][7U] = 1U;
    memory.words[PLSR_DEVICE_D][127U] = 0U;
    TestWriteDword(&memory, PLSR_DEVICE_D, 128U, 2);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_OK);
}

static void TestOutputAndDivider(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_PARSE_CONTEXT context = {0, 0U};
    PLSR_JOB_SNAPSHOT snapshot;
    PLSR_PARSE_DETAIL detail;
    uint16_t psc;
    uint16_t arr;

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    CHECK(PlcDeviceWriteSfd(900U, (1U << 13U)) == PLC_DEVICE_OK);
    CHECK(PlsrBuildJobSnapshot(&call, &context, &snapshot, &detail)
          == PLSR_RESULT_OK);
    CHECK(snapshot.outputMode == PLSR_OUTPUT_AB);
    CHECK(snapshot.pairedTimerClockHz == 84000000UL);
    CHECK(PlsrCalculateTimerDivider(168000000UL, 1UL, &psc, &arr)
          == PLSR_RESULT_OK);
    CHECK(PlsrCalculateTimerDivider(84000000UL, 100000UL, &psc, &arr)
          == PLSR_RESULT_OK);
    CHECK(PlsrCalculateTimerDivider(84000000UL, 0UL, &psc, &arr)
          == PLSR_RESULT_INVALID_ARGUMENT);
    CHECK(PlsrCalculateTimerDivider(1UL, 100000UL, &psc, &arr)
          == PLSR_RESULT_DIVIDER_UNREPRESENTABLE);
    CHECK(PlcDeviceWriteSfd(900U, 0) == PLC_DEVICE_OK);
}

static void TestCoreSubmission(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_STATUS status;
    PLSR_PARSE_DETAIL detail;

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    call.sequence = 500UL;
    CHECK(PlsrInit() == PLSR_RESULT_OK);
    CHECK(PlsrPostCall(&call) == PLSR_RESULT_QUEUED);
    PlsrProcess();
    CHECK(PlsrGetStatus(0U, &status) == PLSR_RESULT_OK);
    CHECK(status.lastCommandResult == PLSR_RESULT_OK);
    CHECK(status.state == PLSR_STATE_ACCEL);
    CHECK(status.jobValid == 1U);
    CHECK(status.segmentCount == 2U);
    CHECK(status.startSegment == 1U);
    CHECK(status.s2Set == 1U);
    CHECK(status.speedClamped == 1U);
    CHECK(PlsrGetLastParseDetail(0U, &detail) == PLSR_RESULT_OK);
    CHECK(detail.result == PLSR_RESULT_OK);
}

static void TestDefaultSfdStartable(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_STATUS status;

    /* 全新 Flash：默认 S2 参数（FOLLOW=50、最大速度=100000 等）应可直接启动。 */
    PlsrPersistenceTestResetStorage();
    CHECK(PlcDeviceInit() == PLC_DEVICE_OK);
    CHECK(PlcDeviceGetLastSfdLoadResult() == PLSR_PERSISTENCE_DEFAULTED);

    TestBuildValidBlocks(&memory);
    call = TestMakeCall(&memory);
    call.sequence = 600UL;

    /* 方向端子是接线参数，未配置（0xFF）时 PULSE/DIR 应报资源错误。 */
    CHECK(PlsrInit() == PLSR_RESULT_OK);
    CHECK(PlsrPostCall(&call) == PLSR_RESULT_QUEUED);
    PlsrProcess();
    CHECK(PlsrGetStatus(0U, &status) == PLSR_RESULT_OK);
    CHECK(status.lastCommandResult == PLSR_RESULT_INVALID_RESOURCE);
    CHECK(status.state == PLSR_STATE_IDLE);

    /* 用户配置方向端子后，其余出厂默认参数应能直接启动。 */
    CHECK(PlcDeviceWriteSfd(906U, 4) == PLC_DEVICE_OK);
    call.sequence = 601UL;
    CHECK(PlsrPostCall(&call) == PLSR_RESULT_QUEUED);
    PlsrProcess();
    CHECK(PlsrGetStatus(0U, &status) == PLSR_RESULT_OK);
    CHECK(status.lastCommandResult == PLSR_RESULT_OK);
    CHECK(status.state == PLSR_STATE_ACCEL);
    CHECK(status.jobValid == 1U);
    CHECK(status.s2Set == 1U);
    CHECK(status.speedClamped == 1U);
    CHECK(status.directionPoint == 4U);

    /* 回到 IDLE，避免资源泄漏影响后续。 */
    CHECK(PlsrPostCommand(&(PLSR_COMMAND){602U, 0U, PLSR_CMD_STOP_IMMEDIATE, 0})
          == PLSR_RESULT_QUEUED);
    PlsrProcess();
    CHECK(PlsrPostEvent(0U, PLSR_EVENT_STOP_IMMEDIATE_DONE)
          == PLSR_RESULT_OK);
    PlsrProcess();
    CHECK(PlsrGetStatus(0U, &status) == PLSR_RESULT_OK);
    CHECK(status.state == PLSR_STATE_STOPPED);
}

int main(void)
{
    PlsrPersistenceTestResetStorage();
    CHECK(PlcDeviceInit() == PLC_DEVICE_OK);
    TestConfigureAxis0K1();
    TestValidSnapshotAndLiveFrequency();
    TestValidationFailures();
    TestDynamicReferences();
    TestOutputAndDivider();
    TestDefaultSfdStartable();
    TestCoreSubmission();

    if (TestFailures != 0)
    {
        (void)printf("FAIL: %d of %d PLSR job checks failed\n",
                     TestFailures,
                     TestChecks);
        return 1;
    }
    (void)printf("PASS: %d PLSR job checks\n", TestChecks);
    return 0;
}