#include "plc_device.h"
#include "plsr_core.h"
#include "plsr_hal_f407.h"
#include "plsr_job.h"
#include "plsr_persistence.h"
#include <stdio.h>
#include <string.h>

#define TEST_WORD_CAPACITY  (3000U)
#define TEST_S0_BASE        (100U)
#define TEST_S1_BASE        (200U)

typedef struct
{
    uint16_t words[3][TEST_WORD_CAPACITY];
} TEST_MEMORY;

static int TestFailures;
static int TestChecks;

#define CHECK(condition)                                                     \
    do                                                                       \
    {                                                                        \
        TestChecks++;                                                        \
        if (!(condition))                                                    \
        {                                                                    \
            TestFailures++;                                                  \
            (void)printf("FAIL line %d: %s\n", __LINE__, #condition);       \
        }                                                                    \
    } while (0)

static uint8_t TestValidateWords(void *context,
                                 PLSR_DEVICE_TYPE device,
                                 uint32_t firstAddress,
                                 uint32_t wordCount)
{
    (void)context;
    (void)device;
    return (((uint64_t)firstAddress + wordCount) <= TEST_WORD_CAPACITY)
               ? 1U
               : 0U;
}

static uint8_t TestReadWord(void *context,
                            PLSR_DEVICE_TYPE device,
                            uint32_t address,
                            uint16_t *value)
{
    TEST_MEMORY *memory = (TEST_MEMORY *)context;

    if ((memory == NULL) || (value == NULL) || (device > PLSR_DEVICE_FD)
        || (address >= TEST_WORD_CAPACITY))
    {
        return 0U;
    }
    *value = memory->words[device][address];
    return 1U;
}

static uint8_t TestReadBit(void *context,
                           PLSR_DEVICE_TYPE device,
                           uint32_t address,
                           uint8_t *value)
{
    (void)context;
    (void)device;
    (void)address;
    *value = 0U;
    return 1U;
}

static void TestWriteDword(TEST_MEMORY *memory,
                           PLSR_DEVICE_TYPE device,
                           uint32_t address,
                           int32_t value)
{
    uint32_t raw = (uint32_t)value;

    memory->words[device][address] = (uint16_t)(raw & 0xFFFFUL);
    memory->words[device][address + 1UL] = (uint16_t)(raw >> 16U);
}

static void TestSetSegment(TEST_MEMORY *memory,
                           uint16_t number,
                           uint32_t frequency,
                           int32_t pulses)
{
    uint32_t base = TEST_S0_BASE + (uint32_t)number * 10UL;

    TestWriteDword(memory, PLSR_DEVICE_D, base, (int32_t)frequency);
    TestWriteDword(memory, PLSR_DEVICE_D, base + 2UL, pulses);
    memory->words[PLSR_DEVICE_D][base + 4UL] = 0U;
    TestWriteDword(memory, PLSR_DEVICE_D, base + 5UL, 0);
    memory->words[PLSR_DEVICE_D][base + 7UL] = 0U;
    TestWriteDword(memory, PLSR_DEVICE_D, base + 8UL, 0);
}

static void TestResetEnvironment(void)
{
    PlsrPersistenceTestResetStorage();
    CHECK(PlcDeviceInit() == PLC_DEVICE_OK);
    CHECK(PlcDeviceWriteSfd(906U, 4) == PLC_DEVICE_OK);
    CHECK(PlsrInit() == PLSR_RESULT_OK);
}

static PLSR_CALL TestMakeCall(TEST_MEMORY *memory)
{
    PLSR_CALL call;

    (void)memset(&call, 0, sizeof(call));
    call.sequence = 10UL;
    call.source.context = memory;
    call.source.validateWords = TestValidateWords;
    call.source.readWord = TestReadWord;
    call.source.readBit = TestReadBit;
    call.s0.device = PLSR_DEVICE_D;
    call.s0.address = TEST_S0_BASE;
    call.s1.device = PLSR_DEVICE_D;
    call.s1.address = TEST_S1_BASE;
    call.s2.type = PLSR_OPERAND_CONSTANT;
    call.s2.constant = 1;
    call.dAxis = 0U;
    call.outputModeOverride = PLSR_OUTPUT_MODE_FROM_SFD;
    return call;
}

static PLSR_STATUS TestGetStatus(void)
{
    PLSR_STATUS status;

    (void)memset(&status, 0, sizeof(status));
    CHECK(PlsrGetStatus(0U, &status) == PLSR_RESULT_OK);
    return status;
}

/* ---- HAL 单测 ---- */

static void TestMapping(void)
{
    (void)PlsrHwInit();
    CHECK(PlsrHwGetTimerClockHz(0U) == 168000000UL);
    CHECK(PlsrHwGetTimerClockHz(1U) == 168000000UL);
    CHECK(PlsrHwGetTimerClockHz(2U) == 168000000UL);
    CHECK(PlsrHwGetTimerClockHz(3U) == 168000000UL);
    CHECK(PlsrHwGetTimerClockHz(4U) == 0UL);
    CHECK(PlsrHwResolveDirectionPoint(4U) != 0U);
    CHECK(PlsrHwResolveDirectionPoint(8U) == 0U);
    CHECK(PlsrHwResolveDirectionPoint(20U) != 0U);
    CHECK(PlsrHwResolveDirectionPoint(21U) == 0U);
}

static void TestDirDelaySequence(void)
{
    (void)PlsrHwInit();
    PLSR_HW_START_PARAMS params;
    uint16_t psc;
    uint16_t arr;
    int ticks;

    (void)memset(&params, 0, sizeof(params));
    params.frequencyHz = 1000UL;
    params.targetPulses = 100;
    params.directionPoint = 4U;
    params.directionPositive = 1U;
    params.directionDelayMs = 10U;

    CHECK(PlsrHwStartPulse(0U, &params) == PLSR_RESULT_OK);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_DIR_SETTLING);
    CHECK(PlsrHwTestGetDirLevel(0U) == 1U);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 0U);
    CHECK(PlsrHwIsPulseActive(0U) == 0U);

    for (ticks = 0; ticks < 9; ticks++)
    {
        PlsrHwTick(0U);
    }
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_DIR_SETTLING);

    PlsrHwTick(0U);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_PWM_PENDING);

    /* 首个非零频率启动 PWM，ARR/CCR 与分频计算一致。 */
    CHECK(PlsrHwSetFrequency(0U, 1000UL) == PLSR_RESULT_OK);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_RUNNING);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 1U);
    CHECK(PlsrHwIsPulseActive(0U) == 1U);
    CHECK(PlsrCalculateTimerDivider(168000000UL, 1000UL, &psc, &arr)
          == PLSR_RESULT_OK);
    CHECK(PlsrHwTestGetArr(0U) == arr);
    CHECK(PlsrHwTestGetPsc(0U) == psc);
    CHECK(PlsrHwTestGetCcr(0U) == arr / 2UL);
    /* PWM 模式 1（OC1M=110）：复位后 CCMR1=0 冻结，无此配置输出恒定电平。 */
    CHECK((PlsrHwTestGetCcmr1(0U) & 0x70UL) == 0x60UL);
    /* ARR/CCR 预装载（ARPE=CR1 bit7，OC1PE=CCMR1 bit3）：
     * 运行中调频不产生提前回绕，否则加速段多出 ~ln(f1/f0) 个假脉冲。 */
    CHECK((PlsrHwTestGetCr1(0U) & 0x80UL) == 0x80UL);
    CHECK((PlsrHwTestGetCcmr1(0U) & 0x08UL) == 0x08UL);

    /* 段间同向衔接：方向不变时跳过方向延时，直接进入 PWM 待启动。 */
    CHECK(PlsrHwStopPulse(0U) == PLSR_RESULT_OK);
    params.targetPulses = 50;
    CHECK(PlsrHwStartPulse(0U, &params) == PLSR_RESULT_OK);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_PWM_PENDING);
    CHECK(PlsrHwTestGetDirLevel(0U) == 1U);

    /* 反向时方向延时仍生效。 */
    params.directionPositive = 0U;
    CHECK(PlsrHwStartPulse(0U, &params) == PLSR_RESULT_OK);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_DIR_SETTLING);
    CHECK(PlsrHwTestGetDirLevel(0U) == 0U);
}

static void TestZeroFrequencyWaits(void)
{
    (void)PlsrHwInit();
    PLSR_HW_START_PARAMS params;

    (void)memset(&params, 0, sizeof(params));
    params.frequencyHz = 0UL;
    params.targetPulses = 50;
    params.directionPoint = PLSR_HW_DIR_POINT_NONE;
    params.directionPositive = 1U;
    params.directionDelayMs = 0U;

    CHECK(PlsrHwStartPulse(0U, &params) == PLSR_RESULT_OK);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_PWM_PENDING);
    PlsrHwTick(0U);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_PWM_PENDING);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 0U);

    /* 起始速度为 0：profile 升频后首个非零频率才启动 PWM。 */
    CHECK(PlsrHwSetFrequency(0U, 10UL) == PLSR_RESULT_OK);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_RUNNING);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 1U);
}

static void TestPulseCounting(void)
{
    (void)PlsrHwInit();
    PLSR_HW_START_PARAMS params;
    int pulse;

    (void)memset(&params, 0, sizeof(params));
    params.frequencyHz = 1000UL;
    params.targetPulses = 5;
    params.directionPoint = PLSR_HW_DIR_POINT_NONE;
    params.directionPositive = 1U;
    params.directionDelayMs = 0U;

    CHECK(PlsrHwStartPulse(0U, &params) == PLSR_RESULT_OK);
    CHECK(PlsrHwSetFrequency(0U, 1000UL) == PLSR_RESULT_OK);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_RUNNING);

    for (pulse = 0; pulse < 4; pulse++)
    {
        PlsrHwTestTriggerUpdate(0U);
        CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_RUNNING);
    }
    /* 第 5 个脉冲：到目标，停止 + 段完成事件。 */
    PlsrHwTestTriggerUpdate(0U);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_DONE);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 0U);
    CHECK(PlsrHwIsPulseActive(0U) == 0U);

    /* 停止后再触发更新中断无动作。 */
    PlsrHwTestTriggerUpdate(0U);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_DONE);
}

static void TestStopAndInvalidArgs(void)
{
    (void)PlsrHwInit();
    PLSR_HW_START_PARAMS params;

    (void)memset(&params, 0, sizeof(params));
    params.frequencyHz = 1000UL;
    params.targetPulses = 100;
    params.directionPoint = PLSR_HW_DIR_POINT_NONE;
    params.directionPositive = 1U;
    params.directionDelayMs = 0U;

    CHECK(PlsrHwStartPulse(0U, &params) == PLSR_RESULT_OK);
    CHECK(PlsrHwSetFrequency(0U, 1000UL) == PLSR_RESULT_OK);
    CHECK(PlsrHwIsPulseActive(0U) == 1U);
    CHECK(PlsrHwStopPulse(0U) == PLSR_RESULT_OK);
    CHECK(PlsrHwIsPulseActive(0U) == 0U);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_IDLE);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 0U);

    CHECK(PlsrHwStartPulse(4U, &params) == PLSR_RESULT_INVALID_ARGUMENT);
    CHECK(PlsrHwStartPulse(0U, NULL) == PLSR_RESULT_INVALID_ARGUMENT);
    params.targetPulses = 0;
    CHECK(PlsrHwStartPulse(0U, &params) == PLSR_RESULT_INVALID_ARGUMENT);
    CHECK(PlsrHwSetFrequency(4U, 1000UL) == PLSR_RESULT_INVALID_ARGUMENT);
    CHECK(PlsrHwStopPulse(4U) == PLSR_RESULT_INVALID_ARGUMENT);
}

/* ---- 端到端集成：START → 硬件 → 计数 → 事件 → 段间 → 完成 ---- */

static void TestEndToEndTwoSegments(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_STATUS status;
    int ticks;
    int pulse;

    TestResetEnvironment();
    (void)memset(&memory, 0, sizeof(memory));
    TestWriteDword(&memory, PLSR_DEVICE_D, TEST_S0_BASE, 2);
    TestSetSegment(&memory, 1U, 1000U, 100);
    TestSetSegment(&memory, 2U, 2000U, 200);

    call = TestMakeCall(&memory);
    CHECK(PlsrPostCall(&call) == PLSR_RESULT_QUEUED);
    PlsrProcess();
    status = TestGetStatus();
    CHECK(status.state == PLSR_STATE_ACCEL);
    CHECK(status.currentSegment == 1U);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_DIR_SETTLING);

    /* DIR 延时 10ms → PWM 启动（段1 起始速度 0，profile 升频后启动）。 */
    for (ticks = 0; ticks < 10; ticks++)
    {
        PlsrProcess();
    }
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_RUNNING);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 1U);

    /* 加速完成 → 状态机进入 RUN。 */
    for (ticks = 0; ticks < 500; ticks++)
    {
        PlsrProcess();
        if (TestGetStatus().state == PLSR_STATE_RUN)
        {
            break;
        }
    }
    status = TestGetStatus();
    CHECK(status.state == PLSR_STATE_RUN);
    CHECK(status.currentSegment == 1U);

    /* 段1 脉冲完成：100 次更新中断 → SEGMENT_COMPLETE → 段2 启动。 */
    for (pulse = 0; pulse < 100; pulse++)
    {
        PlsrHwTestTriggerUpdate(0U);
    }
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_DONE);
    PlsrProcess();
    status = TestGetStatus();
    CHECK(status.state == PLSR_STATE_ACCEL);
    CHECK(status.currentSegment == 2U);

    /* 段2：DIR 延时 → PWM → 加速 → RUN。 */
    for (ticks = 0; ticks < 600; ticks++)
    {
        PlsrProcess();
        if (TestGetStatus().state == PLSR_STATE_RUN)
        {
            break;
        }
    }
    status = TestGetStatus();
    CHECK(status.state == PLSR_STATE_RUN);
    CHECK(status.currentSegment == 2U);

    /* 段2 脉冲完成 → 任务结束。 */
    for (pulse = 0; pulse < 200; pulse++)
    {
        PlsrHwTestTriggerUpdate(0U);
    }
    PlsrProcess();
    status = TestGetStatus();
    CHECK(status.state == PLSR_STATE_COMPLETED);
    CHECK(status.done != 0U);
    /* 终态转换后 HAL 回 IDLE（允许重新启动），脉冲已停止。 */
    CHECK(PlsrHwIsPulseActive(0U) == 0U);
    CHECK(PlsrHwTestGetPwmEnabled(0U) == 0U);
}

static void TestStopStopsHardware(void)
{
    TEST_MEMORY memory;
    PLSR_CALL call;
    PLSR_COMMAND command;
    PLSR_STATUS status;
    int ticks;

    TestResetEnvironment();
    (void)memset(&memory, 0, sizeof(memory));
    TestWriteDword(&memory, PLSR_DEVICE_D, TEST_S0_BASE, 1);
    TestSetSegment(&memory, 1U, 1000U, 10000);

    call = TestMakeCall(&memory);
    call.sequence = 20UL;
    CHECK(PlsrPostCall(&call) == PLSR_RESULT_QUEUED);
    PlsrProcess();
    for (ticks = 0; ticks < 10; ticks++)
    {
        PlsrProcess();
    }
    CHECK(PlsrHwIsPulseActive(0U) == 1U);

    /* STOP_IMMEDIATE：硬件立即停止。 */
    command.sequence = 21UL;
    command.axis = 0U;
    command.opcode = PLSR_CMD_STOP_IMMEDIATE;
    command.argument = 0;
    CHECK(PlsrPostCommand(&command) == PLSR_RESULT_QUEUED);
    PlsrProcess();
    CHECK(PlsrHwIsPulseActive(0U) == 0U);
    CHECK(PlsrHwGetState(0U) == PLSR_HW_STATE_IDLE);

    CHECK(PlsrPostEvent(0U, PLSR_EVENT_STOP_IMMEDIATE_DONE)
          == PLSR_RESULT_OK);
    PlsrProcess();
    status = TestGetStatus();
    CHECK(status.state == PLSR_STATE_STOPPED);
}

int main(void)
{
    TestMapping();
    TestDirDelaySequence();
    TestZeroFrequencyWaits();
    TestPulseCounting();
    TestStopAndInvalidArgs();
    TestEndToEndTwoSegments();
    TestStopStopsHardware();

    if (TestFailures != 0)
    {
        (void)printf("FAIL: %d of %d PLSR HAL checks failed\n",
                     TestFailures,
                     TestChecks);
        return 1;
    }
    (void)printf("PASS: %d PLSR HAL checks\n", TestChecks);
    return 0;
}